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Physical Principles Of Electron Microscopy: An Introducti...
Physical Principles Of Electron Microscopy: An Introduction To Tem, Sem, And Aem, 9780387258003  
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Physical Principles Of Electron Microscopy: An Introduction To Tem, Sem, And Aem

Ray F. Egerton
 
ISBN:   0387258000   List Price:    INR 5,652.47
ISBN-13:   9780387258003       (USD 79.95)
Publisher:   Springer   Pages:    202
Binding:   Hardcover   Weight:    0.9 Pounds
Dimension:   9.7 x 6.1 x 0.6 Inches   Language:    English
Pub. Year:   2005      
Category:   Science / Electron Microscopes & Microscopy
 
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Description:
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of more >>


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More Information: Physical Principles Of Electron Microscopy: An Introducti...
ISBN: 0387258000
ISBN-13: 9780387258003
Title: Physical Principles Of Electron Microscopy: An Introduction To Tem, Sem, And Aem
Author: Ray F. Egerton
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Best Price: Physical Principles Of Electron Microscopy: An Introduction To Tem, Sem, And Aem: 0387258000
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